XUV Group Student Theses
Multi-Angle
Reflectance Measurements in the EUV
by
Cynthia Mills
On Determining
the Optical Constants on
Sputtered U and a-Si at 304 and 584 Å
by Matthew B. Squires
Determination of
the Crystal Phase Dependance
on the Optical Properties of Diamond and Graphite
(Hopg)
Between 30 and 1600 NM
by Matthew
B. Squires
The Measurement (58.4-164.0nm)
and Analysis (40.0-600.0nm)
of the Atomic Scattering Factors of Diamond and
Graphite
by Matthew B. Squires