Group Publications

2023

• Addressing calibration of highharmonic generation sources used for studying magnetism

  Taylor J. Buckway^†, Aaron Redd^‡, Devin Lewis^‡, Eric Gullikson, Joshua Vawdrey^‡, Karine Chesnel, David Allred, and Richard L. Sandberg

  SPIE Optical Engineering and Applications, (San Diego, CA, October 2023). Proc. SPIE 12694, 1269404 (2023).
  
• Variable-angle, spectroscopic ellipsometry study on the repeated application of first contact polymer on silicon-based surfaces

  Joshua J. Vawdrey^‡, James P. Hamilton, and David D. Allred

  SPIE Optical Engineering and Applications, (San Diego, CA, 2023). Proc. SPIE 12666, 1266609 (2023).
  
• Iterating toward change: Improving student-centered teaching through the STEM faculty institute (STEMFI)

  Jeffrey Shipley, Rebecca L. Sansom, Haley Mickelsen, Jennifer B. Nielson, R. Steven Turley, Richard E. West, … (3 other authors)

  PLoS One 18 (8), 1-15 (2023).
  

2022

• Tuning the index of refraction of a polyvinyl toluene and polystyrene copolymer toward a heterogenous, index-matched neutron detector

  Aaron J. Thorum^†, David D. Allred, William G. Pitt, and Troy R. Munro

  J. Appl. Polym. Sci. , e53305 (2022).
  
• Carbon nanotube microfabricated window with extreme ultraviolet transmission and differential pumping

  Scott Olsen^†, Richard Vanfleet, David Allred, and Robert Davis

  UV and Higher Energy Photonics: From Materials to Applications 2022 (San Diego, CA, October 2022). Proc. SPIE 1220102, 1220102 (2022).
  
• Evidence that evaporated Al/AlF₃ bilayer thin films stored in a 327 K oven for over 2500 hours have not degraded

  Kenan Fronk^‡ and David D. Allred

  SPIE Astronomical Telescopes + Instrumentation, 2022, (Montréal, Québec, Canada, August 2022). Proc. SPIE 12181, 121813A (2022).
  
• Stability of lithium fluoride thin films as a function of humidity and temperature

  Tanner D. Rydalch^‡, Devin M. Lewis^‡, and David D. Allred

  SPIE Astronomical Telescopes + Instrumentation, 2022, (Montréal, Québec, Canada, August 2022). Proc. SPIE 12188, 121884M (2022).
  

2021

• The future of plasmaspheric extreme ultraviolet (EUV) imaging

  J. Goldstein, D.L. Gallagher, B.R. Sandel, M. Davis, P. Molyneux, T. Veach, … D.D. Allred, and R.S. Turley (3 other authors)

  Chapter 6 in Understanding the Space Environment through Global Measurements, (Elsevier, 2022).
  
• The future of plasmaspheric extreme ultraviolet (EUV) imaging

  J. Goldstein, D.L. Gallagher, B.R. Sandel, M. Davis, P. Molyneux, T. Veach, … D.D. Allred, and R.S. Turley (3 other authors)

  Chapter 6 in Understanding the Space Environment through Global Measurements, (Elsevier, 2022).
  
• Oxidation of aluminum thin films protected by ultrathin MgF₂ layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

  Brian I. Johnson^†, Tahereh G. Avval^†, R. Steven Turley, Matthew R. Linford, and David D. Allred

  OSA Continuum 4 (3), 879-895 (2021).
  
• Oxidation of aluminum thin films protected by ultrathin MgF₂ layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

  Brian I. Johnson^†, Tahereh G. Avval^†, R. Steven Turley, Matthew R. Linford, and David D. Allred

  OSA Continuum 4 (3), 879-895 (2021).
  
• Ideas for supporting student-centered STEM learning through remote labs: a response

  Richard E. West, Rebecca Sansom, Jennifer Nielson, Geoff Wright, R. Steven Turley, Jamie Jensen, and Michael Johnson

  ETR&D 69 (1), 263-268 (2021).
  

2020

• Illuminating the degradation of lithium fluoride mirror coatings in humid environments

  Devin M. Lewis^‡, Caleb Michael Plewe^‡, Alexandra Gallion Stapley^‡, Joshua J. Vawdrey^‡, R. Steven Turley, and David D. Allred

  Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, (Online, December 2020). Proc. SPIE 11451, (2020).
  
• Illuminating the degradation of lithium fluoride mirror coatings in humid environments

  Devin M. Lewis^‡, Caleb Michael Plewe^‡, Alexandra Gallion Stapley^‡, Joshua J. Vawdrey^‡, R. Steven Turley, and David D. Allred

  Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, (Online, December 2020). Proc. SPIE 11451, (2020).
  
• Retardation of the oxidation of aluminum thin films in low-oxygen and cryogenic environments

  S. Merlin Hart^‡, Donovan K. Smith^‡, and David D. Allred

  Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, (Online, December 2020). Proc. SPIE 11451, 788-800 (2020).
  
• A carbon nanotube structure for an EUV window with differential pumping

  Scott Olsen^†, Richard Vanfleet, David Allred, Steve Turley, and Robert Davis

  Advances in X-Ray/EUV Optics and Components XV, (August 2020). Proc. SPIE 11491, 1149104-1 (2020).
  
• A carbon nanotube structure for an EUV window with differential pumping

  Scott Olsen^†, Richard Vanfleet, David Allred, Steve Turley, and Robert Davis

  Advances in X-Ray/EUV Optics and Components XV, (August 2020). Proc. SPIE 11491, 1149104-1 (2020).
  
• Oxide structure of air-passivated U-6Nb alloy thin films

  Erik B. Watkins, Izabela Kruk, Jaroslaw Majewski, and David D. Allred

  J. Nucl. Mater. 539, 152356 (2020).
  
• Thermal Properties of Thin Film Uranium Oxides and Thorium Oxides

  Aaron Thorum^‡, Logan Page^‡, Troy Munro, David Allred, Zilong Hua, and David Hurley

  Proceedings of the ASME 2019, International Mechanical Engineering Congress and Exposition, IMECE2019 (Salt Lake City, UT, November 2019).
  

2019

• Optical constants of evaporated amorphous zinc arsenide (Zn₃As₂) via spectroscopic ellipsometry

  J. Colter Stewart^‡, Micah N. Shelley^‡, Nathan R. Schwartz^‡, Spencer K. King^‡, Daniel W. Boyce^‡, James W. Erikson^‡, David D. Allred, and John S. Colton

  Opt. Mater. Express 9 (12), 4677-4687 (2019).
  
• Using ellipsometry and x-ray photoelectron spectroscopy for real-time monitoring of the oxidation of aluminum mirrors protected by ultrathin MgF₂ layers

  Brian I. Johnson^†, Tahereh G. Avval^†, Grant T. Hodges^‡, Victoria Carver^‡, Karen Membreno^‡, David D. Allred, and Matthew R. Linford

  Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems II, 111160O (San Diego, CA, September 2019). Proc. SPIE 11116, (2019).
  
• Oxidation of Aluminum Protected by Wide Band Gap MgF₂ Layers as Followed by X-ray Photoelectron Spectroscopy

  Brian I. Johnson, Tahereh Gholian Avval, Grant P. Hodges, Karen Membreno, David D. Allred, and Matthew R. Linford

  Society of Vacuum Coaters, 2019 Technical Conference Proceedings, Optical Coatings (August 22, 2019).
  
• Expanding the Far UV Range of Aluminum-Coated Mirrors for Space-Based Observations to Reflect Hydrogen Lyman Lines via Fluoride Multilayers

  David D. Allred, Leoul E. Tilahun, J. Gabriel Richardson^‡, and R. Steven Turley

  Optical Interference Coatings 2019, (Santa Ana Pueblo, NM, June 2019).
  
• Expanding the Far UV Range of Aluminum-Coated Mirrors for Space-Based Observations to Reflect Hydrogen Lyman Lines via Fluoride Multilayers

  David D. Allred, Leoul E. Tilahun, J. Gabriel Richardson^‡, and R. Steven Turley

  Optical Interference Coatings 2019, (Santa Ana Pueblo, NM, June 2019).
  
• Y₂O₃ optical constants between 5 nm and 50 nm

  Joseph B. Muhlestein^‡, Benjamin D. Smith^‡, Margaret Miles^†, Stephanie M. Thomas^‡, Anthony Willey^†, David D. Allred, and R. Steven Turley

  Opt. Express 27 (3), 3324-3336 (2019).
  
• Y₂O₃ optical constants between 5 nm and 50 nm

  Joseph B. Muhlestein^‡, Benjamin D. Smith^‡, Margaret Miles^†, Stephanie M. Thomas^‡, Anthony Willey^†, David D. Allred, and R. Steven Turley

  Opt. Express 27 (3), 3324-3336 (2019).
  
• Think First, Act Later - A Course Structure for Improving Student Designed Experiments

  Nathan D. Powers, Dallin S. Durfee, and David D. Allred

  2018 Conference on Laboratory Instruction Beyond the First Year of College, Part of the BFY Conference series, (Baltimore, MD, July, 2018).
  

2018

• Optimization of Broadband Multilayer Mirror Reflectivity via a Genetic Algorithm

  Michael Greenburg^‡, David D. Allred, and R. Steven Turley

  Annual Conference of the Utah Academy of Sciences, Arts, & Letters (Orem, UT, April 2017). J. Utah Acad. Sci. 94, 317-325 (2018).
  
• Optimization of Broadband Multilayer Mirror Reflectivity via a Genetic Algorithm

  Michael Greenburg^‡, David D. Allred, and R. Steven Turley

  Annual Conference of the Utah Academy of Sciences, Arts, & Letters (Orem, UT, April 2017). J. Utah Acad. Sci. 94, 317-325 (2018).
  
• Effects of Roughness on Reflection of Monochromatic Light

  Spencer Thevenin and R. Steven Turley

  Annual Conference of the Utah Academy of Sciences, Arts, & Letters (Orem, UT, April 2017). J. Utah Acad. Sci. 94, 335-346 (2018).
  

2017

• Adding EUV reflectance to aluminum-coated mirrors for space-based observation

  David D. Allred, R. Steven Turley, Stephanie M. Thomas^‡, Spencer G. Willett^‡, Michael J. Greenburg^‡, and Spencer B. Perry^‡

  UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII Proc. SPIE 10398, 34-01 (2017).
  
• Adding EUV reflectance to aluminum-coated mirrors for space-based observation

  David D. Allred, R. Steven Turley, Stephanie M. Thomas^‡, Spencer G. Willett^‡, Michael J. Greenburg^‡, and Spencer B. Perry^‡

  UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII Proc. SPIE 10398, 34-01 (2017).
  
• Formation of solid thorium monoxide at near-ambient conditions as observed by neutron reflectometry and interpreted by screened hybrid functional calculations

  Heming He, Jaroslaw Majewski, David D. Allred, Peng Wang, Xiaodong Wen, and Kirk D. Rector

  J. Nucl. Mater. 487, 288-296 (2017).
  
• An inexpensive high-temperature optical fiber thermometer

  Travis J. Moore, Matthew R. Jones, Dale R. Tree, and David D. Allred

  J. Quant. Spectrosc. Radiat. Transf. 187, 358-363 (2017).
  

2016

• Platonic Forms as a Model of Modern Physics: Confessions of an Experimental Physicist

  R. Steven Turley

  15th Annual ACTC Association for Core Texts and Courses, (Memphis, TN, April 2009). Published in Memory, Invention, and Delivery, R. Dagger, C. Metress, and J. Lee editors (University Press of America, Lanham MD, 2016), pp. 31-45.
  
• Determining Thin-Film Roughness with Extreme Ultraviolet Reflection

  Cody L. Petrie^‡, Joshua Marx^‡, David Squires^‡, and R. Steven Turley

  2015 Annual Conference of the Utah Academy of Sciences, Arts, & Letters, (Ephraim, UT, March 2015). J. Utah Acad. Sci. 92, 239-255 (2016).
  

2015

• High-Aspect-Ratio Metal Microfabrication by Nickel Electroplating of Patterned Carbon Nanotube Forests

  Lawrence K. Barrett^†, Dallin J. Barton^‡, Steven G. Noyce^‡, David D. Allred, Richard R. Vanfleet, and Robert C. Davis

  J. Microelectromech. Syst. 24 (5), 1331-1337 (2015).
  

2014

• Orbital and spin moments of 5 to 11 nm Fe₃O₄ nanoparticles measured via x-ray magnetic circular dichroism

  Y. P. Cai^†, K. Chesnel, M. Trevino^‡, A. Westover^‡, R. G. Harrison, J. M. Hancock^†, S. Turley, … (7 other authors)

  J. Appl. Phys. 115 (17), 17B537 (2014).
  
• Numerical Literacy for Physics Undergraduates

  R. Steven Turley

  Comput. Sci. Eng. 16 (2), (2014).
  

2013

• Determination of the Insulation Gap of Uranium Oxides by Spectroscopic Ellipsometry and Density Functional Theory

  Heming He, David A. Andersson, David D. Allred, and Kirk D. Rector

  J. Phys. Chem. C 117 (32), 16540-16551 (2013).
  
• The Effect of Surface Roughness on Reflected Intensity

  Gregory R. Hart^‡ and R. Steven Turley

  J. Utah Acad. Sci. 89, 169-180 (2013).
  
• Non-Specular Reflectance in the Extreme Ultraviolet

  Quintin Nethercott^‡, Cody Petrie^‡, and R. Steven Turley

  J. Utah Acad. Sci. 89, 181-193 (2013).
  

2012

• Characterization of Chemical Speciation in Ultrathin Uranium Oxide Layered Films

  Heming He, P. Wang, D. D. Allred, Jaroslaw Majewski, M. P. Wilkerson, and Kirk D. Rector

  Anal. Chem. 84 (23), 10380-10387 (2012).
  
• Effect of iron catalyst thickness on vertically aligned carbon nanotube forest straightness for CNT-MEMS

  Kellen Moulton^‡, Nicholas B. Morrill^‡, Adam M. Konneker^‡, Brian D. Jensen, Richard R. Vanfleet, David D. Allred, and Robert C. Davis

  J. Micromech. Microeng. 22 (5), 055004 (2012).
  
• Fabrication and Testing of a Strain-Based Carbon Nanotube Magnetometer Structure

  J. A. Brame^‡, J. E. Goodsell^‡, S. A. Getty, Y. Zheng, and D. D. Allred

  J. Utah Acad. Sci. 88, 444-454 (2012).
  
• Physical Science Foundations

  Scott Bergeson, Juliana Boerio-Goates, Michael D. Joner, Bart J. Kowalis, M. Jeanette Lawler, J. Ward Moody, … R. Steven Turley, Eric Hirschmann, and B. Kent Harrison (2 other authors)

  BYU Academic Publishing; 4th edition (2012)
  

2011

• Measurement of the Imaginary Index of Refraction of UOx in the Extreme Ultraviolet

  Heidi M. Dumais^†, R. Steven Turley, and David D. Allred

  J. Utah Acad. Sci. 87, 255-265 (2011).
  
• Measurement of the Imaginary Index of Refraction of UOx in the Extreme Ultraviolet

  Heidi M. Dumais^†, R. Steven Turley, and David D. Allred

  J. Utah Acad. Sci. 87, 255-265 (2011).
  
• Polymer molded templates for nanostructured amorphous silicon photovoltaics

  Lei Pei^†, Amy Balls^‡, Cary Tippets^‡, Jonnathan Abbott^†, Matthew R. Linford, Jian Hu, … David D. Allred, Richard R. Vanfleet, and Robert C. Davis (1 other authors)

  J. Vac. Sci. Technol. A 29, 021017 (2011).
  

2010

• Diode properties of nanotube networks

  Bryan Hicks^‡, Stephanie Getty, and David Allred

  Thin Solid Films 518 (17), 5014-5017 (2010).
  
• For Now We See Through a Glass Darkly

  R. Steven Turley

  J. Utah Acad. Sci. 86, 35-43 (2010).
  
• Characterization of optical constants for uranium from 10 to 47 nm

  Nicole Brimhall^†, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

  Appl. Optics 49 (9), 1581-1585 (2010).
  
• Characterization of optical constants for uranium from 10 to 47 nm

  Nicole Brimhall^†, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

  Appl. Optics 49 (9), 1581-1585 (2010).
  

2009

• Measured optical constants of copper from 10 nm to 35 nm

  Nicole Brimhall^†, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

  Opt. Express 17 (26), 23873-23879 (2009).
  
• Measured optical constants of copper from 10 nm to 35 nm

  Nicole Brimhall^†, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

  Opt. Express 17 (26), 23873-23879 (2009).
  
• Effective Medium Theory, Rough Surfaces, and Moth's Eyes

  R. Steven Turley, David Allred, Anthony Willey^†, Joseph Muhlestein^†, and Zephne Larsen^‡

  J. Utah Acad. Sci. 86, 273-286 (2009).
  
• Effective Medium Theory, Rough Surfaces, and Moth's Eyes

  R. Steven Turley, David Allred, Anthony Willey^†, Joseph Muhlestein^†, and Zephne Larsen^‡

  J. Utah Acad. Sci. 86, 273-286 (2009).
  
• A balloon lens: Acoustic scattering from a penetrable sphere

  Derek C. Thomas^†, Kent L. Gee, and R. Steven Turley

  Am. J. Phys. 77 (3), 197-203 (2009).
  
• Presidential Address

  Steve Turley

  J. Utah Acad. Sci. 85, 29-36 (2009).
  

2008

• Eliminating carbon contamination on oxidized Si surfaces using a VUV excimer lamp

  Elisabeth (Liz) Strein^† and David Allred

  Thin Solid Films 517 (3), 1011-1015 (2008).
  
• Eliminating adventitious carbon contamination on SiO2 using a UV excimer lamp

  E. Strein^†, D. Allred, and R. S. Turley

  Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
  
• Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy

  Guillermo Acosta^†, Richard Vanfleet, David D. Allred, and R. S. Turley

  Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
  
• Eliminating adventitious carbon contamination on SiO2 using a UV excimer lamp

  E. Strein^†, D. Allred, and R. S. Turley

  Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
  
• Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy

  Guillermo Acosta^†, Richard Vanfleet, David D. Allred, and R. S. Turley

  Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
  
• Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics

  Nicole Brimhall^†, Matthew Turner^‡, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

  Rev. Sci. Instrum. 79 (10), 103108 (2008).
  
• Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics

  Nicole Brimhall^†, Matthew Turner^‡, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

  Rev. Sci. Instrum. 79 (10), 103108 (2008).
  
• Determining the refractive index in the extreme ultraviolet using Kramers-Kronig on thin-film scandium oxide transmission data

  Jacqualine Jackson Butterfield^† and David D. Allred

  J. Utah Acad. Sci. 85, 203-211 (2008).
  
• Surface Roughness of Thin Films

  R. Steven Turley, Elise Martin^‡, and Jed Johnson^†

  J. Utah Acad. Sci. 84, 161-171 (2008).
  
• Installation of a Grazing Incidence Monochromator for use in the Extreme Ultraviolet

  Sarah B. Mitchell^‡ and R. Steven Turley

  J. Utah Acad. Sci. 84, 154-160 (2008).
  

2007

• Thin-film iron-catalyzed "beads on a string" carbon nanotubes

  Jonathan Goodsell^†, Stephanie A. Getty, Jon Brame^‡, and David D. Allred

  J. Utah Acad. Sci. 84, 130-140 (2007).
  
• Bounds and Conditions, A Kolob In Our Solar System

  David Allred

  Sunstone , (2007).
  
• Strain-based Electrical Properties of Systems of Carbon Nanotubes Embedded in Parylene

  Jon Brame^‡, Stephanie Getty, Johnathan Goodsell^†, and David D. Allred

  2006 Materials Research Society Fall Meeting, (November 2006, Boston, MA). MRS Proc. 963, 0893-JJ05-09 (2007).
  
• X-Ray Photoelectron Spectroscoopy to Examine Molecular Composition

  Amy Grigg^‡, Kristi Adamson^‡, Jed Johnson^†, Niki Farnsworth^†, and R. Steven Turley

  J. Utah Acad. Sci. 81, 213-221 (2007).
  

2006

• Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry

  William R. Evans^† and David D. Allred

  Thin Solid Films 515 (3), 847-853 (2006).
  
• Simultaneous Reflection and Transmission Measurements from Coated Diodes to Determine the Optical Constants of Thin Films in the Extreme Ultraviolet

  D. D. Allred, G. A. Acosta^†, N. Farnsworth-Brimhall^†, and R. S. Turly

  Society of Vacuum Coaters, 2006 Technical Conference Proceedings, Optical Coating (April 2006, Washington, DC). Proc. SVC 2006, 314-325 (2006).
  
• Simultaneous Reflection and Transmission Measurements from Coated Diodes to Determine the Optical Constants of Thin Films in the Extreme Ultraviolet

  D. D. Allred, G. A. Acosta^†, N. Farnsworth-Brimhall^†, and R. S. Turly

  Society of Vacuum Coaters, 2006 Technical Conference Proceedings, Optical Coating (April 2006, Washington, DC). Proc. SVC 2006, 314-325 (2006).
  
• Thorium dioxide thin films in the extreme ultraviolet

  Nicole F. Brimhall^†, Amy B. Grigg^†, R. Steven Turley, and David D. Allred

  Proc. SPIE 6317, 631711 (2006).
  
• Thorium dioxide thin films in the extreme ultraviolet

  Nicole F. Brimhall^†, Amy B. Grigg^†, R. Steven Turley, and David D. Allred

  Proc. SPIE 6317, 631711 (2006).
  
• Understanding DC-bias sputtered thorium oxide thin films useful in EUV optics

  William R. Evans^†, Sarah C. Barton, Michael Clemens^†, and David D. Allred

  Advances in X-Ray/EUV Optics, Components, and Applications, (August 2006, San Diego, CA).  Proc. SPIE 6317, 631711 (2006).
  
• Construction of an extreme ultraviolet polarimeter based on high-order harmonic generation

  N. Brimhall^†, J. C. Painter^†, M. Turner^†, S. V. Voronov^†, R. S. Turley, M. Ware, and J. Peatross

  Advances in X-Ray/EUV Optics, Components, and Applications, (August 2006, San Diego, CA). Proc. SPIE 6317, (2006).
  
• Intermediate Martian Atmospheric Study and Demonstration

  Donovan Chipman^‡, Andrew Ning^‡, and David Allred

  SpaceOps 2006 Conference, (June 2006, Rome, Italy)
  
• PECVD growth of Six:Ge1-x films for high speed devices and MEMS

  Srinivasan Kannan, Craig Taylor, and David Allred

  J. Non-Cryst. Solids 352 (9-20), 1272-1274 (2006).
  
• Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV

  Jed E. Johnson^†, David D. Allred, R. Steven Turley, William R. Evans^†, and Richard L. Sandberg^‡

  2005 Materials Research Society Fall Meeting, Symposium JJ – Actinides 2005 – Basic Science, Applications and Technology, (November 2005, Boston, MA). MRS Proc. 893, 207-214 (2006).
  
• Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV

  Jed E. Johnson^†, David D. Allred, R. Steven Turley, William R. Evans^†, and Richard L. Sandberg^‡

  2005 Materials Research Society Fall Meeting, Symposium JJ – Actinides 2005 – Basic Science, Applications and Technology, (November 2005, Boston, MA). MRS Proc. 893, 207-214 (2006).
  
• Physical Science Foundations, 2nd Edition

  J. Ward Moody, M. Jeanette Lawler, Juliana Boerio-Goates, R. Steven Turley, David V. Dearden, Bart J. Kowallis, and Michael D. Joner

  (BYU Academic Publishing, Provo, UT), Jennifer Berry.
  

2005

• A Technique for Measuring the Thin Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, using Atomic Force Microscopy

  Guillermo Acosta^†, David D. Allred, and Robert C. Davis

  Summer 2005 SVC Bulletin , 34-38 (2005).
  
• Determining Composition of Thin Films of Uranium Oxide by X-Ray Photoelectron Spectroscopy

  Kristi Adamson^‡, Shannon Lunt^†, Richard Sandberg^†, Elke Jackson^‡, David Allred, and R. Steven Turley

  J. Utah Acad. Sci. 82, 176-186 (2005).
  
• Determining Composition of Thin Films of Uranium Oxide by X-Ray Photoelectron Spectroscopy

  Kristi Adamson^‡, Shannon Lunt^†, Richard Sandberg^†, Elke Jackson^‡, David Allred, and R. Steven Turley

  J. Utah Acad. Sci. 82, 176-186 (2005).
  
• Physical Science Foundations, 1st Edition

  J. Ward Moody, M. Jeannette Lawler, Juliana Boerio-Goates, R. Steven Turley, David V. Dearden, Bart J. Kowallis, and Michael D. Joner
  

2004

• Determining ruthenium's optical constants in the spectral range 11-14 nm

  Luke J. Bissel^‡, David d. Allred, R. Steven Turley, William R. Evans^†, and Jed. E. Johnson^†

  Proc. SPIE 5538, 84-91 (2004).
  
• Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region

  Richard L. Sandberg^†, David d. Allred, Shannon Lunt^†, Marie K. Urry^‡, and R. Steven Turley

  Proc. SPIE 5538, 84-91 (2004).
  
• Determining ruthenium's optical constants in the spectral range 11-14 nm

  Luke J. Bissel^‡, David d. Allred, R. Steven Turley, William R. Evans^†, and Jed. E. Johnson^†

  Proc. SPIE 5538, 84-91 (2004).
  
• Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region

  Richard L. Sandberg^†, David d. Allred, Shannon Lunt^†, Marie K. Urry^‡, and R. Steven Turley

  Proc. SPIE 5538, 84-91 (2004).
  
• Uranium Oxide as a Highly Reflective Coating from 100-400 eV

  Richard L. Sandberg^†, David D. Allred, Luke J. Bissell^‡, Jed E. Johnson^†, and R. Steven Turley

  AIP Conf. Proc. 705, 796-799 (2004).
  
• Uranium Oxide as a Highly Reflective Coating from 100-400 eV

  Richard L. Sandberg^†, David D. Allred, Luke J. Bissell^‡, Jed E. Johnson^†, and R. Steven Turley

  AIP Conf. Proc. 705, 796-799 (2004).
  
• Removing Surface Contaminants from Silicon Wafers to Facilitate EUV Optical Characterization

  R. E. Robinson^‡, R. L. Sandberg^†, D. D. Allred, A. L. Jackson, J. E. Johnson^†, W. Evans^†, T. Doughty^‡, … K. Adamson^†, and A. Jacquier^† (1 other authors)

  47th Annual Technical Conference Proceedings, (Dallas, TX, April 2004), Vol. 47, (Society of Vacuum Coaters, Albuquerque, NM, 2004) 368-376.
  
• A comparison of uranium oxide and nickle as single-layer reflectors from 2.7 to 11.6 nm

  Richard L. Sandberg^†, David D. Allred, Jed E. Johnson^†, and R. Steven Turley

  Proc. SPIE 5193, 191-203 (2004).
  
• A comparison of uranium oxide and nickle as single-layer reflectors from 2.7 to 11.6 nm

  Richard L. Sandberg^†, David D. Allred, Jed E. Johnson^†, and R. Steven Turley

  Proc. SPIE 5193, 191-203 (2004).
  
• X-ray and EUV spectral instruments for plasma source characterization

  Alexander P. Shevelko, Yuri S. Kasyanov, Larry V. Knight, James Phillips, James Phillips, R. Steven Turley, D. Clark Turner, and Oleg F. Yakushev

  Proc. SPIE 5196, 282-288 (2004).
  

2003

• What the Universe Means to People Like Me

  David D. Allred

  Dialogue 36, 110-125 (2003).
  
• A capillary discharge plasma source of intense VUV radiation

  I. I. Sobelman, A. P. Shevelko, O. F. Yakushev, L. V. Knight, and R. S. Turley

  Quantum Electron. 33 (1), 3-6 (2003).
  

2002

• Highly Reflective Uranium Mirrors for Astrophysics Applications

  David D. Allred, Matthew B. Squires^†, R. Steven Turley, Webster Cash, and Ann F. Shipley

  Proc. SPIE 4782, 212-223 (2002).
  
• Highly Reflective Uranium Mirrors for Astrophysics Applications

  David D. Allred, Matthew B. Squires^†, R. Steven Turley, Webster Cash, and Ann F. Shipley

  Proc. SPIE 4782, 212-223 (2002).
  
• Mars Jars

  David Allred

  Fifth International Mars Society Conference, (August 2002, Boulder, CO).
  
• The Optical Constants of Sputtered U and a Si at 30.4 and 58.4 nm

  M. B. Squires^†, David D. Allred, and R. Steven Turley

  J. Utah Acad. Sci. 76, 74-87 (2002).
  
• The Optical Constants of Sputtered U and a Si at 30.4 and 58.4 nm

  M. B. Squires^†, David D. Allred, and R. Steven Turley

  J. Utah Acad. Sci. 76, 74-87 (2002).
  
• Determination by Spectral Analysis of the Electron Temperature of an Electrical Pulse-Generated Plasma

  D. Hullinger^†, R. Bradford^‡, C. Crawford^†, and R. S. Turley

  J. Utah Acad. Sci. 76, 108-113 (2002).
  
• The Use of Genetic Algorithms in Multilayer Mirror Optimization

  S. Lunt^† and R. S. Turley

  J. Utah Acad. Sci. 76, 61-73 (2002).
  

2001

• Intense XUV source of radiation within the 4- to 45-nm spectral range based on capillary discharge plasmas

  Alexander P. Shevelko , Larry V. Knight, R. Steven Turley, and Oleg F. Yakushev

  Proc. SPIE 4504, 143-150 (2001).
  
• Design of bifunctional XUV multilayer mirrors using a genetic algorithm

  Shannon Lunt^†, R. Steven Turley, and David D. Allred

  J. X-ray Sci. Technol. 9, 1-11 (2001).
  
• Comments on "Numerical solution of 2-D scattering problems using high-order methods" - Authors' reply

  L. R. Hamilton, J. J. Ottusch, M. A. Stalzer, R. S. Turley, J. L. Visher, and S. M. Wandzura

  IEEE Trans. Antennas Propag. 49 (1), 111-111 (2001).
  
• Design of bifunctional XUV multilayer mirrors using a genetic algorithm

  Shannon Lunt^†, R. Steven Turley, and David D. Allred

  J. X-ray Sci. Technol. 9, 1-11 (2001).
  

2000

• GoldHelox solar x-ray telescope testing progress report

  Jonathan P. Barnes^†, Peter W. A. Roming^†, J. W. Moody , R. Steven Turley , Paul F. Eastman, T. Lloyd^‡, K. D. Eldredge^‡, Allen L. Raines^†, … and R. Takahashi^† (17 other authors)

  Proc. SPIE (4012), 448-455 (2000).
  
• The extreme ultraviolet imager investigation for the IMAGE mission

  B. R. Sandel, A. L. Broadfoot, C. C. Curtis, R. A. King, T. C. Stone, R. H. Hill, … D. D. Allred, R. S. Turley, … (4 other authors)

  Space Sci. Rev. 91 (1-2), 197-242 (2000).
  
• The extreme ultraviolet imager investigation for the IMAGE mission

  B. R. Sandel, A. L. Broadfoot, C. C. Curtis, R. A. King, T. C. Stone, R. H. Hill, … D. D. Allred, R. S. Turley, … (4 other authors)

  Space Sci. Rev. 91 (1-2), 197-242 (2000).
  

1999

• Dual-function EUV multilayer mirrors for the IMAGE mission

  David D. Allred, R. Steven Turley, and Matthew B. Squires^†

  Proc. SPIE 3767, 280-287 (1999).
  
• Dual-function EUV multilayer mirrors for the IMAGE mission

  David D. Allred, R. Steven Turley, and Matthew B. Squires^†

  Proc. SPIE 3767, 280-287 (1999).
  
• EUV spectroscopy of ultrafast capillary discharges

  Larry V. Knight, R. Steven Turley, Chris Crawford^†, Derek Hullinger^†, Alexander P. Shevelko, Oleg F. Yakushev , and Richard Miller

  Proc. SPIE 3767, 45-49 (1999).
  
• Optical constants of sputtered U and a-Si at 30.4 and 58.4 nm

  Matthew B. Squires^†, David D. Allred, and R. Steven Turley

  Proc. SPIE 3767, 288-294 (1999).
  
• Optical constants of sputtered U and a-Si at 30.4 and 58.4 nm

  Matthew B. Squires^†, David D. Allred, and R. Steven Turley

  Proc. SPIE 3767, 288-294 (1999).
  
• Numerical solution of 2-D scattering problems using high-order methods

  L. R. Hamilton, J. J. Ottusch, M. A. Stalzer, R. S. Turley, J. L. Visher, and S. M. Wandzura

  IEEE Trans. Antennas Propag. 47 (4), 683-691 (1999).
  
• A rotating electrochemical cell to prepare porous silicon with different surface structures

  R. Osorio-Saucedo, C. Vázquez-López, W. Calleja, D. D. Allred, and C. Falcony

  Thin Solid Films 338 (1-2), 100-104 (1999).
  

1997

• Reactive Gas Magnetron Sputtering of Lithium Hydride and Lithium Fluoride Thin Films

  G. B. Thompson^‡ and D. D. Allred

  J. X-ray Sci. Technol. 7 (2), 159-170 (1997).
  
• NASA G-133 "GoldHelox": A Project Update

  M. K. Spute^‡, M. L. Hintz, P. W. A. Roming^†, T. Lloyd^‡, R. S. Turley, J. W. Moody, A. Raines^‡, T. J. Utley, Jr.^‡, … (2 other authors)

  J. X-ray Sci. Technol. 7 (3/4), 215 (1997).
  

1996

• Structural phase transition and T_c distribution in Hf-doped LaMnO₃ investigated using perturbed-angular-correlation spectroscopy

  Gary L. Catchen, William E. Evenson, and David Allred

  Phys. Rev. B 54 (6), R3679-R3682 (1996).
  
• The Structure of W/C (0.15 < γ < 0.8) Multilayers Annealed in Argon or Air

  J. Gonzalez-Hernandez, B. S. Chao, S. R. Ovshinsky, and D. D. Allred

  J. X-ray Sci. Technol. 6 (1), 1-31 (1996).
  
• Raman spectrographic system for quantitative analysis of isotopic hydrogen mixtures for muon catalysis experiments

  Steven E. Jones, David S. Shelton, R. Steven Turley, M. Jeannette Lawler, and David D. Allred

  Hyperfine Interact. 102, 695-698 (1996).
  
• Raman spectrographic system for quantitative analysis of isotopic hydrogen mixtures for muon catalysis experiments

  Steven E. Jones, David S. Shelton, R. Steven Turley, M. Jeannette Lawler, and David D. Allred

  Hyperfine Interact. 102, 695-698 (1996).
  

1995

• Deconvolution of the Raman spectrum of amorphous carbon

  Qi Wang^†, D. D. Allred, and L. V. Knight

  J. Raman Spectrosc. 26 (12), 1039-1043 (1995).
  
• Observation of beam-induced changes in the polarization of Balmer-α radiation emitted following beam-tilted-foil transmission

  Douglas L. Harper, Royal G. Albridge, Norman H. Tolk, Wang Qi^†, David D. Allred, and Larry V. Knight

  Phys. Rev. A 52 (6), 4631-4639 (1995).
  
• Fastscat Benchmark Data

  L. Hamilton, J. Ottusch, M. Stalzer, R. S. Turley, J. Visher, and S. Wandzura

  HAVE Forum Proceedings (Classified Government Publication), Vol. 1, p. 255, February 1995.
• Waterjet cutting of cross‐linked glass

  Fang Yuan^†, John A. Johnson^†, David D. Allred, and Robert H. Todd

  J. Vac. Sci. Technol. A 13 (1), 136 (1995).
  

1994

• Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions

  W. I. Karain^†, Larry V. Knight, David D. Allred, and A. Reyes-Mena

  J. Vac. Sci. Technol. A 12 (4), 2581 (1994).
  
• Raman spectroscopic study of the formation of t‐MoSi2 from Mo/Si multilayers

  M. Cai^†, D. D. Allred, and A. Reyes-Mena

  J. Vac. Sci. Technol. A 12 (4), 1535 (1994).
  
• Mesostructure of photoluminescent porous silicon

  F. Ruiz, C. Vázquez-López, J. González-Hernández, David D. Allred, G. Romero-Paredes, R. Peña-Sierra, and G. Torres-Delgado

  J. Vac. Sci. Technol. A 12 (4), 2565 (1994).
  

1993

• Use of Raman spectroscopy in characterizing soft x-ray multilayers: tools in understanding structure and interfaces

  Ming Cai^†, Qi Wang^†, David D. Allred, Larry V. Knight, Dorian M. Hatch, Arturo Reyes-Mena, and Guizhong Zhang

  24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials, (September 1992, Boulder, CO). Proc. SPIE 1848, 521 (1993).
  
• The use of sharp silicon tips as photocathodes and electron sources for X-ray generation

  W. I. Karain^†, L. V. Knight, D. D. Allred, and A. Reyes-Mena

  Nanostruct. Mat. 3 (1-6), 419-424 (1993).
  
• Photoluminescence and absorption studies of defects in CdTe and Zn_xCd_1-xTe crystals

  Cheryl Barnett Davis, David D. Allred, A. Reyes-Mena, J. González-Hernández, Ovidio González, Bret C. Hess, and Worth P. Allred

  Phys. Rev. B 47 (20), 13363-13369 (1993).
  
• Low-frequency feature in the first-order Raman spectrum of amorphous carbon

  Qi Wang^†, D. D. Allred, and Jesus González-Hernández

  Phys. Rev. B 47 (10), 6119-6121 (1993).
  

1992

• Using thin-film stress to produce precision, figured X-ray optics

  F. Yuan^†, Y. Shi^†, L. V. Knight, R. T. Perkins^†, and D. D. Allred

  Thin Solid Films 220 (1-2), 284-288 (1992).
  
• Fast fourier-transform techniques for solving the electric-field integral-equation for a periodic body

  S. M. Wandzura, C. B. Thorington, R. S. Turley, and L. R. Hamilton

  IEE Proc. H 139 (5), 401-406 (1992).
  
• Raman Spectroscopic Analysis of Mo/Si Multilayers

  David D. Allred, Ming Cai^†, Qi Wang^†, Dorian M. Hatch, and A. Reyes-Mena

  J. X-ray Sci. Technol. 3 (3), 222-228 (1992).
  
• Multilayer phase diffraction gratings modeled as a structure in three dimensions

  Douglas P. Hansen ^†, Arturo Reyes-Mena , John R. Colton, Larry V. Knight, and David D. Allred

  Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (July 1992, San Diego, CA). Proc. SPIE 1742, 476 (1992).
  
• X-ray diode using a silicon field-emission photocathode

  Wael I. Karain^†, Larry V. Knight, David D. Allred, and Arturo Reyes-Mena

  Soft X-Ray Microscopy, (July 1992, San Diego, CA). Proc. SPIE 1741, 12-18 (1992).
  
• Manufacturing of atomically sharp silicon tips and their use as photocathodes

  W. I. Karain^†, Larry V. Knight, David D. Allred, and A. Reyes-Mena

  J. Utah Acad. Sci. 69, 257-272 (1992).
  
• Characterization of as‐prepared and annealed W/C multilayer thin films

  J. Gonzalez-Hernandez, B. S. Chao, D. A. Pawlik, D. D. Allred, and Qi Wang^†

  J. Vac. Sci. Technol. A 10 (1), 145-151 (1992).
  

1991

• Transmittances of thin polymer films and their suitability as a supportive substrate for a soft x-ray solar filter

  Memorie K. Williams^‡, Evan Hansen ^‡, Arturo Reyes-Mena, and David D. Allred

  EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (July 1991, San Diego, CA). Proc. SPIE 1549, 147-154 (1991).
  
• Advanced infrared optically black baffle materials

  Roland D. Seals, Charles M. Egert, and David D. Allred

  Optical Surfaces Resistant to Severe Environments, (July 1991, San Diego, CA). Proc. SPIE 1330, 164-167 (1991).
  
• The effect of oxygen on the structure of annealed w/c multilayer thin-films

  S. S. Chao, D. A. Pawlik, J. González-Hernández, Qi Wang^†, and D. D. Allred

  Solid State Commun. 79 (3), 205-207 (1991).
  
• Structure and optical characterization of Zn x Cd1−x Te thin films prepared by the close spaced vapor transport method

  J. González-Hernández, O. Zelaya, J. G. Mendoza-Alverez, E. López-Cruz, D. A. Pawlik, and D. D. Allred

  J. Vac. Sci. Technol. A 9 (3), 550-554 (1991).
  

1990

• Diffuse absorbing beryllium coatings produced by magnetron sputtering

  Charles M. Egert and David D. Allred

  Proc. SPIE 1331, 170-178 (1990).
  
• Photoluminescence studies in Zn x Cd1−x Te single crystals

  J. González-Hernández, Elías López-Cruz, D. D. Allred, and Worth P. Allred

  J. Vac. Sci. Technol. A 8 (4), 3255-3259 (1990).
  
• Photoconductive characterization of Zn x Cd1−x Te (0≤x≤0.25) single crystal alloys

  Elías López-Cruz, J. González-Hernández, D. D. Allred, and W. P. Allred

  J. Vac. Sci. Technol. A 8 (3), 1934-1938 (1990).
  
• Deposition of Zinc Selenide by Atomic Layer Epitaxy for Multilayer X-Ray Optics

  J. K. Shurtleff^†, D. D. Allred, R. T. Perkins^†, and J. M. Thorne

  Materials Research Society
  
• Annealing Behavior of The Photoluminescence Lines in CdTe and Znx Cd1−x Te Single Crystals

  J. Gonzalez-Hernandez, A. Reyes-Mena, Elias Lopez-Cruz, D. D. Allred, and Worth P. Allred

  Materials Research Society
  
• Characterization of Metal/Carbon Multilayers by Raman Spectroscopy

  David D. Allred, Qi Wang^†, and Jesus Gonzalez-Hernandez

  Materials Research Society
  

1989

• Design Of High Performance Soft X-Ray Windows

  Raymond T. Perkins^†, David D. Allred, Larry V. Knight, and James M. Thorne

  X-Ray/EUV Optics for Astronomy and Microscopy, (July 1989, San Diego, CA).  Proc. SPIE 1160, 56-65 (1989).
  
• Use Of Raman Spectroscopy In The Characterization Of Soft X-Ray Multilayer Reflectors

  Qi Wang^†, David D. Allred, L. V. Knight, and Jesus Gonzalez-Hernandez

  Proc. SPIE 1160, 229-234 (1989).
  
• Multilayer X-Ray Optics Produced By Atomic Layer Epitaxy

  J. K .Shurtleff^†, D. D. Allred, R. T. Perkins^†, and J. M. Thorne

  Proc. SPIE 1159, 664 (1989).
  

1988

• Angular distributions for ¹⁶O(γ,p)¹⁵N at intermediate energies

  G. S. Adams, E. R. Kinney, J. L. Matthews, W. W. Sapp, T. Soox, R. O. Owens, R. S. Turley, and G. Pignault

  Phys. Rev. C 38 (6), 2771-2776 (1988).
  
• Accelerated Life Test for Thermoelectric Junctions: Solder Element Interactions

  David D. Allred and On Van Nbuyen

  Proceedings of the Seventh International Conference on Thermoelectric Energy Conversion
  

1987

• Superconductivity at 155 K

  S. R. Ovshinsky, R. T. Young, D. D. Allred, G. DeMaggio, and G. A. Van der Leeden

  Phys. Rev. Lett. 58 (24), 2579-2581 (1987).
  
• Anneal Induced Changes in Amorphous Semiconductor Multilayers

  J. Gonzalez-Hernandez, D. D. Allred, and O. V. Nguyen

  Materials Research Society
  

1986

• Comparison Of Effective Medium Procedures For Optical Modeling Of Laminar Structures

  Robert F. Edgerton and David D. Allred

  Proc. SPIE 0821, 167-173 (1986).
  
• A New Multiphase Thermoelectric Material for Power Generation

  O. V. Nguyen, David D. Allred, and S. R. Ovshinsky

  Sixth Internional Conference on Thermoelectric Energy Conversion, (March 1986, Arlington, TX).
  
• Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces

  D. D. Allred, J. Gonzalez-Hernandez, O. V. Nguyen, D. Martin, and D. Pawlik

  J. Mat. Res. 1, 468-475 (1986).
  
• Two-body photodisintegration of ⁴He in the 100–360 MeV region

  R. A. Schumacher, J. L. Matthews, W. W. Sapp, R. S. Turley, G. S. Adams, and R. O. Owens

  Phys. Rev. C 33 (1), 50-58 (1986).
  

1985

• Spectrally selective surfaces by chemical vapor-deposition

  David D. Allred, Michael R. Jacobson, and Elizabeth E. Chain

  Sol. Energ. Mater. 12 (2), 87-129 (1985).
  
• The o-16(gamma,po)n-15 reaction at E-gamma = 196 MeV

  R. S. Turley, E. R. Kinney, J. L. Matthews, W. W. Sapp, E. J. Scheidker, R. A. Schumacher, … (3 other authors)

  Phys. Lett. B 157 (1), 19-22 (1985).
  

1984

• Optical Properties of Amorphous Germanium Films Prepared by CVD

  David D. Allred and J. A. Piontkowski

  Fifth International Conference on Thermoelectric Energy Conversion, (March 1984, Arlington, TX), 546-557 (1984).
  
• Thermal Diffusivity by Modified Angstrom Technique

  N. Jackett, David D. Allred, T. H. Sein, and J. U. Trefny

  Fifth International Conference on Thermoelectric Energy Conversion, (March 1984, Arlington, TX), p 116-119 (1984).
  

1983

• CVD a-Ge and a-Ge:X Films: Preparation and Properties

  David D. Allred and J. A. Piontkowski

  Fourth European Conference on Chemical Vapour Deposition
  

1982

• Cu(γ,p)X reaction at E_γ=150 and 300 MeV

  R. A. Schumacher, G. S. Adams, D. R. Ingham, J. L. Matthews, W. W. Sapp, R. S. Turley, R. O. Owens, and B. L. Roberts

  Phys. Rev. C 25 (5), 2269-2277 (1982).
  

1981

• Chemically vapor-deposited ZrB2 as a selective solar absorber

  E. Randich and D. D. Allred

  Thin Solid Films 83 (4), 393-398 (1981).
  
• The Hydrogen Content of Multicomponent Amorphous Silicon Alloys by 19F Nuclear Reaction Analysis

  D. D. Allred, D. C. Booth, B. R. Appleton, P. D. Miller, C. D. Moak, J. P. F. Sellschop, C. W. White, and A. L. Wintenberg

  IEEE Trans. Nucl. Sci. 28 (2), 1838-1840 (1981).
  

1980

• Retarding crystallization of CVD amorphous silicon by alloying

  D.C. Booth, D. D. Allred, and B. O. Seraphin

  J. Non-Cryst. Solids 35-36 (1), 213-218 (1980).
  

1979

• Stabilized CVD amorphous silicon for high temperature photothermal solar energy conversion

  D. C. Booth, D. D. Allred, and B. O. Seraphin

  Sol. Energ. Mater. 2 (1), 107-124 (1979).
  
• Selective Surfaces by Chemical Vapor Deposition

  David D. Allred

  Second Annual Coating for Solar Collectors Symposium
  
• Optical properties and structure of amorphous silicon films prepared by CVD

  M. Janai, D. D. Allred, D. C. Booth, and B. O. Seraphin

  Sol. Energ. Mater. 1, 11-27 (1979).
  
• Stabilized cvd amorphous silicon for high-temperature photothermal solar-energy conversion

  D.C. Booth, D.D. Allred, and B. O. Seraphin

  Sol. Energ. Mater. 2 (1), 107-124 (1979).
  

1978

• Chemical Vapor Deposited Molybdenum Films For Use In Photothermal Conversion'

  G. E. Carver, D. D. Allred, and B. O. Seraphin

  Proc. SPIE 0161, 66-71 (1978).
  
• Chemical Vapor Deposited Amorphous Silicon For Use In Photothermal Conversion

  D. C. Booth, M. Janai, G. Weiser, D. D. Allred, and B. O. Seraphin

  Proc. SPIE 0161, 72-77 (1978).
  
• Application of nuclear-reactions for quantitative hydrogen analysis in a variety of different materials problems

  G. J. Clark, C. W. White, D. D. Allred, B. R. Appleton, F. B. Koch, and C. W. Magee

  Nucl. Instr. Meth. 149 (1-3), 9-18 (1978).
  
• Profiling hydrogen in materials using ion-beams

  J.F. Ziegler, C.P. Wu, P. Williams, C. W. White, B. Terreault, B. M. U. Scherzer, … and D. D. Allred (20 other authors)

  Nucl. Instr. Meth. 149 (1-3), 19-39 (1978).
  
• Hydrogen concentration profiles in quartz determined by a nuclear-reaction technique

  G. J. Clark, C. W. White, D. D. Allred, B. R. Appleton, and I. S. T. Tsong

  Phys. Chem. Miner. 3 (2), 199-211 (1978).

1977

• The use of nuclear reactions and SIMS for quantitative depth profiling of hydrogen in amorphous silicon

  G. J. Clark, C. W. White, D. D. Allred, B. R. Appleton, C. W. Magee, and D. E. Carlson

  Appl. Phys. Lett. 31, 582-585 (1977).
  

1972

• β-Delayed Proton Decay of C9

  John E. Esterl, David Allred, J. C. Hardy, R. G. Sextro, and Joseph Cerny

  Phys. Rev. C 6 (1), 373-375 (1972).
  

^‡Undergraduate Student Author

^†Graduate Student Author